Development of a soft X-ray angle-resolved photoemission system applicable to 100 m crystals

7Citations
Citations of this article
7Readers
Mendeley users who have this article in their library.

Abstract

A system for angle-resolved photoemission spectroscopy (ARPES) of small single crystals with sizes down to 100 m has been developed. Soft X-ray synchrotron radiation with a spot size of ∼40 μm × 65 μm at the sample position is used for the excitation. Using this system an ARPES measurement has been performed on a Si crystal of size 120 μm × 100 μm × 80 μm. The crystal was properly oriented on a sample stage by measuring the Laue spots. The crystal was cleaved in situ with a microcleaver at 100 K. The cleaved surface was adjusted to the beam spot using an optical microscope. Consequently, clear band dispersions along the-X direction reflecting the bulk electronic states were observed with a photon energy of 879 eV. © 2011 International Union of Crystallography Printed in Singapore - all rights reserved.

Cite

CITATION STYLE

APA

Muro, T., Kato, Y., Matsushita, T., Kinoshita, T., Watanabe, Y., Okazaki, H., … Suga, S. (2011). Development of a soft X-ray angle-resolved photoemission system applicable to 100 m crystals. Journal of Synchrotron Radiation, 18(6), 879–884. https://doi.org/10.1107/S0909049511034418

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free