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Journal ArticleOPEN ACCESS

Towards Quantitative Analysis of STEM Image Contrast of Interfaces and Surfaces

  • Stemmer S
  • LeBeau J
  • Findlay S
  • et al.
Microscopy and Microanalysis (2010) 16(S2) 1472-1473
DOI: 10.1017/s1431927610061684
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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APA

Stemmer, S., LeBeau, J., Findlay, S., D’Alfonso, A., & Allen, L. (2010). Towards Quantitative Analysis of STEM Image Contrast of Interfaces and Surfaces. Microscopy and Microanalysis, 16(S2), 1472–1473. https://doi.org/10.1017/s1431927610061684

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