Operando Structural Characterization of the E-ALD Process Ultra-Thin Films Growth

  • Giaccherini A
  • Felici R
  • Innocenti M
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Abstract

Abstract Long-haul travel does not constitute an obstacle for tourists to travel and is fast gaining the attention of tourists in new and unique experiences. This study was conducted to identify the long-haul travel motivation by international tourists to Penang. A total of 400 respondents participated in this survey, conducted around the tourist attractions in Penang, using cluster random sampling. However, only 370 questionnaires were only used for this research. Data were analysed using SPSS software 22 version. The findings, ‘knowledge and novelty seeking’ were the main push factors that drove long-haul travel by international tourists to Penang. Meanwhile, the main pull factor that attracts long- haul travel by international tourists to Penang was its ‘culture and history’. Additionally, there were partly direct and significant relationships between socio-demographic, trip characteristics and travel motivation (push factors and pull factors). Overall, this study identified the long-haul travel motivations by international tourists to Penang based on socio-demographic, trip characteristics and travel motivation and has indirectly helped in understanding the long-haul travel market particularly for Penang and Southeast Asia. This research also suggested for an effective marketing and promotion strategy in pro- viding useful information that is the key to attract international tourists to travel long distances. Keywords:

Figures

  • Figure 1. General scheme for an E-ALD process aimed to grow a ternary chalcogenide. C, M1 and M2, respectively, stand for an atomic layer of chalcogenide, first metal in the scheme and second metal in the scheme.
  • Table 1. Mismatches for Cd chalcogenides on different epitaxial relationship for Ag(111) and Au(111) substrates.
  • Figure 2. Technical specification for an electrochemical flow cell used in operando SXRD experiments.
  • Figure 3. Transmission of X-ray at different energy through different surface.
  • Table 2. Characteristic length of possible CuS /Ag(111) and Cu2S /Ag(111) surfaces.
  • Figure 4. Operando (in situ), ex situ, and simulated l-scans (0.73, 0.73, l).
  • Figure 5. Diffracted intensity during the growth of Cu2S ultra-thin film.

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APA

Giaccherini, A., Felici, R., & Innocenti, M. (2017). Operando Structural Characterization of the E-ALD Process Ultra-Thin Films Growth. In X-ray Characterization of Nanostructured Energy Materials by Synchrotron Radiation. InTech. https://doi.org/10.5772/67355

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