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Measuring Strain in Semiconductor Nanostructures by Convergent Beam Electron Diffraction

  • Clément L
  • Rouviere J
  • Cacho F
  • et al.
DOI: 10.1007/978-1-4020-8615-1_92
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Clément, L., Rouviere, J.-L., Cacho, F., & Pantel, R. (2008). Measuring Strain in Semiconductor Nanostructures by Convergent Beam Electron Diffraction (pp. 423–428). https://doi.org/10.1007/978-1-4020-8615-1_92

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