Machine learning techniques are indispensable in today’s data-driven fault diagnosis methodolgoies. Among many machine techniques, k-nearest neighbor (k-NN) is one of the most widely used for fault diagnosis due to its simplicity, effectiveness, and computational efficiency. However, the lack of a density-based affinity measure in the conventional k-NN algorithm can decrease the classification accuracy. To address this issue, a sequential k-NN classification methodology using distance- and density-based affinity measures in a sequential manner is introduced for classification.
CITATION STYLE
Pecht, M., Ramaswami, G. K., Hodkiewicz, M., Cripps, E., & Kim, J. M. (2016). A sequential k-nearest neighbor classification approach for data-driven fault diagnosis using distance- and density-based affinity measures. Lecture Notes in Computer Science (Including Subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics), 9714 LNCS, 253–261. https://doi.org/10.1007/978-3-319-40973-3_25
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