Understanding degradation of organic light-emitting diodes from magnetic field effects

Abstract

The impact of magnetic field effects on the electroluminescence of organic light-emitting diodes is commonly used to characterize exciton dynamics such as generation, annihilation, and performance degradation. However, interpreting these effects is challenging. Here, we show that magnetic field effects in organic light-emitting diodes can be understood in terms of the magnetic response of device characteristics derived from polaron-pair and triplet exciton quenching processes, such as triplet-polaron interactions and triplet-triplet annihilation. Device degradation shows a clear relationship with the amplitude of the magnetic field effects, enabling non-destructive measurement of the degradation. The results and proposed mechanism provide a better understanding of magnetic field effects on organic light-emitting diodes and device degradation phenomena.