Electron Microscopy: Principle, Components, Optics and Specimen Processing

  • Dey P
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Abstract

Electron microscope (EM) uses high-energy electron beam as probe instead of visible light. The electrons have shorter wavelength and provides very high-resolution capacity (0.1 nm) and 500,000 times magnification power. It is also easy to manipulate the electron...

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Dey, P. (2018). Electron Microscopy: Principle, Components, Optics and Specimen Processing. In Basic and Advanced Laboratory Techniques in Histopathology and Cytology (pp. 253–262). Springer Singapore. https://doi.org/10.1007/978-981-10-8252-8_26

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