Higl-resolution strain mapping in bulk samples using full-profile analysis of ellergy-dispersive synchrotron X-ray diffraction data

Abstract

The feasibility of both high spatial and strain resolution is demonstrated using high-energy X-rays between 100 and 300 keV on beamline ID15A at the ESRF. The data analysis was performed using a multiple-peak Pawley-type refinement on the recorded spectra. An asymmetric peak profile was necessary in order to obtain a point-to-point uncertainty of 10-5. The measurements have been validated with complementary techniques or reference data. © 004 International Union of Crystallography Printed in Great Britain - all rights reserved.