Leather inspection based on wavelets

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Abstract

This paper presents a new methodology to detect leather defects, based on the wavelet transform. The methodology uses a bank of optimised filters, where each filter is tuned to one defect type. Filter shape and wavelet sub-band are selected based the maximisation of the ratio between features values on defect regions and on normal regions. The proposed methodology can detect defects even when small features variations are present, which are not detect by generic texture classification techniques, and is fast enough to be used for real-time leather inspection. © Springer-Verlag Berlin Heidelberg 2005.

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APA

Sobral, J. L. (2005). Leather inspection based on wavelets. In Lecture Notes in Computer Science (Vol. 3523, pp. 682–688). Springer Verlag. https://doi.org/10.1007/11492542_83

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