Controlled and reproducible fabrication of nano-structured materialsis one of the main scientific and industrial challenges for the nextfew years. We have recently proposed exploitation of the nano-structuringpotential of a high resolution focused ion beam tool to overcomebasic limitations of current nano-fabrication techniques. The aimof this article is to present our research efforts in combining ionsource and ion optics specifically for high-resolution applications.First, we detail the very high resolution FIB instrument we havedeveloped specifically to meet nano-fabrication requirements. Finally,we present the instrument now capable of fabricating directly nano-poreswith diameters below 5 nm.
CITATION STYLE
Gierak, J., Madouri, A., Biance, A. L., Bourhis, E., Patriarche, G., Ulysse, C., … Hawkes, P. (2008). Nano-FIB from Research to Applications — a European Scalpel for Nanosciences. In Microscopy of Semiconducting Materials 2007 (pp. 431–440). Springer Netherlands. https://doi.org/10.1007/978-1-4020-8615-1_93
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