Appraising the spectral interference of dysprosium on 27 analytes using capacitively coupled device detectorbased inductively coupled plasma atomic emission spectrometry without physical/chemical separation

Abstract

In this work, a capacitively coupled device-based inductively coupled plasma atomic emission spectrometry method was used to determine the spectral interference of electron-rich elements for assessing some common analytes (Ag, Al, B, Ba, Ca, Cd, Co, Cr, Cu, Fe, Ga, In, Li, Mg, Mn, Na, Ni, Sr, Pb, Tl, and Zn) and some rare earth elements (Ce, Gd, La, Lu, Nd, and Pr) in a dysprosium matrix. The foremost lines for each of these elements were chosen after checking the analytical performance such as sensitivity, detection limit, linear dynamic range and precision, tolerance level, and correction factor due to the spectral interference of the electron-rich dysprosium (Dy). This methodology was verified by using synthetic samples and comparing the results with other reliable methods. The proposed method is efficient, simple, and less time-consuming for the determination of analytes in a Dy matrix without requiring physical/chemical separation.