Potential Path of DNA Damage: Electron Attachment–Induced DNA Single-Strand Breaks

  • Gu J
  • Wang J
  • Leszczynski J
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Gu, J., Wang, J., & Leszczynski, J. (2012). Potential Path of DNA Damage: Electron Attachment–Induced DNA Single-Strand Breaks. In Practical Aspects of Computational Chemistry II (pp. 511–536). Springer Netherlands. https://doi.org/10.1007/978-94-007-0923-2_14

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