Abstract
The use of microscopy in the structural characterization of mesoporous silicon has been widespread with the most popular techniques being several electron microscopies, Raman, and atomic force microscopy. The general field is reviewed including other techniques such as luminescence and multiphoton microscopy to study the optoelectronic properties, and acoustic microscopy to study the mechanical properties.
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CITATION STYLE
APA
Martín-Palma, R. J., & Torres-Costa, V. (2014). Microscopy of porous silicon. In Handbook of Porous Silicon (pp. 413–421). Springer International Publishing. https://doi.org/10.1007/978-3-319-05744-6_41
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