In-situ, Real-Time Investigation of Organic Thin Film Growth Using Reflectance Difference Spectroscopy

Abstract

We review our recent work on the in-situ studies of organic thin films in ultra high vacuum (UHV) using reflectance difference spectroscopy (RDS). By monitoring in real time the evolution of the optical anisotropy of surfaces and the growing organic layers, the interface formation and subsequent growth behavior can be clearly revealed. At the same time, the influence of molecule-molecule and molecule-substrate interactions on the optical properties of the organic thin films can be explored. The assets of RDS as a versatile technique for real-time studies of organic thin film growth on inorganic substrates (metals, insulators and nanostructured templates) as well as organic–organic heteroepitaxial growth will be illustrated for selected examples.