A novel method to detect program malfunctioning on embedded devices using run-time trace

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Abstract

Security is an essential part of development in embedded systems. Execution of unknown or malicious program through an unauthorized means of communication on an embedded system can cause unwanted system behavior. To safeguard the sensitive data and devices, presently, sophisticated hardware and software systems based on cryptographic techniques are required which in turn increases the system’s cost. In this paper, we proposed a method of securing such embedded devices which cannot afford to have capabilities comparable to conventional computers. This method generates a run-time trace on embedded devices during program execution, using already available hardware circuitry on the board. It observes and analyzes the obtained data using data analysis techniques and detects whether any change is occurred in the program compared to previously obtained data.

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Singhal, G., & Roy, S. (2019). A novel method to detect program malfunctioning on embedded devices using run-time trace. In Lecture Notes in Electrical Engineering (Vol. 526, pp. 491–500). Springer Verlag. https://doi.org/10.1007/978-981-13-2553-3_47

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