Application of Atomic Force Microscopy in Organic and Perovskite Photovoltaics

Abstract

Atomic force microscopy (AFM) has become widely used technique in air, liquids, or vacuum to generate high-resolution topographic images of a surface having a nanometer-scale resolution. AFM gives the information about the morphology, phase composition etc. Photovoltaic materials have been attracting intense interest due to their performance and the morphology as well as quality of these materials affects their performance. AFM is now a day widely used technique for morphology and other electronic properties measurements at nanoscale for photovoltaic materials to understand their relation with device performance. This chapter describe the brief introduction of Kelvin probe force microscopy (KPFM) and conducting atomic force microscopy (CAFM) and their application in electrical characterization at nanoscale of organic and perovskite photovoltaic materials.