Thickness dependences of optical constants for thin layers of some metals and semiconductors

  • Kovalenko S
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Abstract

Intensive investigations of zero-, one-, two-dimensional solid formations are directed on improving scientific basis of principally new electronic elements technology design which based on quantum dots, wires and wells. These re- searches have caused new stimulus for experimental ...

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Kovalenko, S. A. (2001). Thickness dependences of optical constants for thin layers of some metals and semiconductors. Semiconductor Physics, Quantum Electronics and Optoelectronics, 4(4), 353–357. https://doi.org/10.15407/spqeo4.04.352

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