Intensive investigations of zero-, one-, two-dimensional solid formations are directed on improving scientific basis of principally new electronic elements technology design which based on quantum dots, wires and wells. These re- searches have caused new stimulus for experimental ...
CITATION STYLE
Kovalenko, S. A. (2001). Thickness dependences of optical constants for thin layers of some metals and semiconductors. Semiconductor Physics, Quantum Electronics and Optoelectronics, 4(4), 353–357. https://doi.org/10.15407/spqeo4.04.352
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