Interfacial properties and growth dynamics of semiconductor interfaces

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Abstract

We present computational results on dynamics and properties of semiconductor materials and interfaces. The adsorption of cyclooctyne on silicon can be shown to proceed barrierless into an on-top structure. Comparing different interfaces of the GaP/Si system, a preference for mixed interfaces (i.e. not purely Si/Ga or Si/P) can be found and understood in terms of the electrostatic potential across the interface and chemical bonding specifics. In further work, the electronic structure of mixed III/V semiconductors will be studied in the way described here for GaAs and used for the prediction of optical properties.

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Rosenow, P., Stegmüller, A., Pecher, J., & Tonner, R. (2016). Interfacial properties and growth dynamics of semiconductor interfaces. In High Performance Computing in Science and Engineering ’15: Transactions of the High Performance Computing Center, Stuttgart (HLRS) 2015 (pp. 199–213). Springer International Publishing. https://doi.org/10.1007/978-3-319-24633-8_13

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