Super-resolution enhancement method based on generative adversarial network for integral imaging microscopy

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Abstract

The integral imaging microscopy system provides a three-dimensional visualization of a microscopic object. However, it has a low-resolution problem due to the fundamental limitation of the F-number (the aperture stops) by using micro lens array (MLA) and a poor illumination environment. In this paper, a generative adversarial network (GAN)-based super-resolution algorithm is proposed to enhance the resolution where the directional view image is directly fed as input. In a GAN network, the generator regresses the high-resolution output from the low-resolution input image, whereas the discriminator distinguishes between the original and generated image. In the generator part, we use consecutive residual blocks with the content loss to retrieve the photo-realistic original image. It can restore the edges and enhance the resolution by ×2, ×4, and even ×8 times without seriously hampering the image quality. The model is tested with a variety of low-resolution microscopic sample images and successfully generates high-resolution directional view images with better illumination. The quantitative analysis shows that the proposed model performs better for microscopic images than the existing algorithms.

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APA

Alam, M. S., Kwon, K. C., Erdenebat, M. U., Abbass, M. Y., Alam, M. A., & Kim, N. (2021). Super-resolution enhancement method based on generative adversarial network for integral imaging microscopy. Sensors, 21(6), 1–17. https://doi.org/10.3390/s21062164

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