A new 1 GS/s sampling rate and 400 μV resolution with reliable power consumption dynamic latched type comparator

Abstract

A new high-speed dynamic latched type comparator with reliable resolution is presented in this paper. The proposed paper presents a 1 GS/s sampling rate in presence of 8 mV input offset, and it can detect the very low voltage differences such as ±200 µV at the output nodes, reliably. The power consumption and delay time of the proposed circuit are 750 µw and 257 ps with the power supply of 1.8 V, respectively. Furthermore, the proposed structure is the suitable candidate for high-speed SAR ADC, as well. Simulation results of the suggested circuit are performed using the BSIM3 model of a 0.18 µm CMOS process with the power supply of 1.8 V at all process corners along with the different temperatures in the region −50 to +50 °C, reliably.