Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
CITATION STYLE
Sawada, H., Watanabe, M., Okunishi, E., & Kondo, Y. (2011). Auto-Tuning of Aberrations Using High-Resolution STEM Images by Auto-Correlation Function. Microscopy and Microanalysis, 17(S2), 1308–1309. https://doi.org/10.1017/s1431927611007410
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