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Journal ArticleOPEN ACCESS

New Equipment for Correlative FIB/TEM/Atom Probe and Site-Specific Preparation Using STEM Live Imaging

  • Felfer P
  • Cairney J
Microscopy and Microanalysis (2011) 17(S2) 756-757
DOI: 10.1017/s143192761100465x
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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Felfer, P., & Cairney, J. (2011). New Equipment for Correlative FIB/TEM/Atom Probe and Site-Specific Preparation Using STEM Live Imaging. Microscopy and Microanalysis, 17(S2), 756–757. https://doi.org/10.1017/s143192761100465x

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