Extracting device fingerprints from flash memory by exploiting physical variations

Abstract

We evaluate seven techniques for extracting unique signatures from NAND flash devices based on observable effects of process variation. Four of the techniques yield usable signatures that represent different trade-offs between speed, robustness, randomness, and wear imposed on the flash device. We describe how to use the signatures to prevent counterfeiting and uniquely identify and/or authenticate electronic devices. © 2011 Springer-Verlag.