Structural Properties of Heterostructures

Abstract

Structural properties of epitaxial layers are pointed out in this chapter with some emphasis on zincblende and wurtzite crystals. After a brief review on perfect, polytype, and mixed bulk crystals we focus on elastic properties of pseudomorphic strained-layer structures. Then the concept of critical layer thickness is introduced, and dislocations relieving the strain in epitaxial layers are presented. X-ray diffraction—the standard tool for structural characterization—is outlined at the end of the chapter.