CITATION STYLE
Delaportas, D., Aden, P., Muckle, C., Yeates, S., Treutlein, R., Haq, S., & Alexandrou, I. (2008). Cross Section High Resolution Imaging of Polymer-Based Materials. In Microscopy of Semiconducting Materials 2007 (pp. 203–206). Springer Netherlands. https://doi.org/10.1007/978-1-4020-8615-1_44
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