Electronics and control for atomic force microscopy

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Abstract

We introduce the time domain and the frequency domain approaches to electronic signals. Then we discuss some basic electronic components, such as voltage divider, low-pass filter, and operational amplifier. We continue to discuss topics more closely related to atomic force microscopy such as the feedback electronics, which in AFM serves to stabilize the tip-sample distance. We close this chapter on electronics by discussing how digital-to-analog converters and analog-to-digital converters work in principle.

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APA

Voigtländer, B. (2019). Electronics and control for atomic force microscopy. In Springer Series in Geomechanics and Geoengineering (pp. 87–118). Springer Verlag. https://doi.org/10.1007/978-3-030-13654-3_5

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