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Image Simulation

  • Williams D
  • Carter C
Springer US, (2009), 533-548
DOI: 10.1007/978-0-387-76501-3_30
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Abstract

When we need to obtain information about the specimen in two directions, we need to align the specimen close to a low-index zone axis. If theHRTEMimage information is going to be directly interpretable, the specimen must be oriented with the incident beam exactly aligned with both the optic axis of the TEM and the zone axis of the specimen. Thus, we will have many reflections excited and the simple two-beam analysis of Chapter 27 cannot be used.

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Williams, D. B., & Carter, C. B. (2009). Image Simulation. In Transmission Electron Microscopy (pp. 533–548). Springer US. https://doi.org/10.1007/978-0-387-76501-3_30

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