Microstructure Analysis and Properties of Anti-Reflection Thin Films for Spherical Silicon Solar Cells

  • Kanayama M
  • Oku T
  • Akiyama T
  • et al.
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Abstract

Structure and properties of anti-reflection thin films of spherical silicon solar cells were investigated and discussed. Conversion efficiencies of spherical Si solar cells coated with F-doped SnO2 anti-reflection films were improved by annealing. Optical absorption and fluorescence of the solar cells increased after annealing. Lattice constants of F-doped SnO2 anti-reflection layers, which were investigated by X-ray diffraction, decreased after annealing. A mechanism of atomic diffusion of F in SnO2 was discussed. The present work indicated a guideline for spherical silicon solar cells with higher efficiencies.

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Kanayama, M., Oku, T., Akiyama, T., Kanamori, Y., Seo, S., Takami, J., … Murozono, M. (2013). Microstructure Analysis and Properties of Anti-Reflection Thin Films for Spherical Silicon Solar Cells. Energy and Power Engineering, 05(02), 18–22. https://doi.org/10.4236/epe.2013.52a003

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