Estimation of the Charge Collection for the Soft-Error Immunity by the 3D-Device Simulation and the Quantitative Investigation

Ohno, Y., Kishimoto, T., Sonoda, K., Sayama, H., Komori, S., Kinomura, A., … Miyoshi, H. (1995). Estimation of the Charge Collection for the Soft-Error Immunity by the 3D-Device Simulation and the Quantitative Investigation. In Simulation of Semiconductor Devices and Processes (pp. 302–305). Springer Vienna. https://doi.org/10.1007/978-3-7091-6619-2_73