Characterizing ferroelectricity with an atomic force microscopy: An all-around technique

Abstract

Atomic Force Microscopy (AFM) arises as an all-in-one characterization technique, capable of measuring several physical quantities by slight equipment’s modifications. In particular, for piezo and ferroelectricity properties, the AFM overcame the limitations of macroscopic techniques. This chapter covers all the aspects of piezo and ferroelectricity measurements performed with an AFM. The chapter is divided in three main parts, one for each available technique: Piezoresponse Force Microscopy (PFM), Nano-PUND method and Direct Piezoelectric Force Microscopy (DPFM). While PFM method is based in the converse piezoelectric effect, nanoPUND measures polarization charges and DPFM measures the direct piezoelectric effect. The working principle and characteristics for each AFM mode is fully exploited and explained from entry level to more advanced users. The chapter also focuses in useful guidelines and practical hands-on explanation for maximizing the image quality and data acquisition. Finally, a set of different application based in the use of piezo and ferroelectric materials is depicted, in which the AFM characterization took an important role as the primary characterization technique.