Phase slips are topological fluctuation events that carry the superconducting order-parameter field between distinct current carrying states and impart a non-zero resistance to superconducting nanowires. They play a fundamental role in determining the fate of superconductivity in nanowires. Conversely, superconducting nanowires provide an ideal setting for accessing non-trivial fluctuations driven by thermal activation and - at low temperatures - by quantum tunneling of a one-dimensional field. However, this potential has not been fully realized because resistance measurements, on the one hand, are capable of capturing only the averaged phase-slip behavior, and on the other hand, are incapable of pinning down the low temperature phase-slip behavior, as the measured resistance values drop below the noise floor. On going beyond the linear-response regime, the I-V characteristics show a hysteretic behavior. As the current is ramped up repeatedly, the state switches from a superconductive to a resistive one, doing so at somewhat random current values below the depairing critical current. The distribution of these switching currents was studied recently. I will report on the rather counter-intuitive temperature dependence of the distribution and its theoretical understanding via a stochastic model. It will be shown that although, in general, several phase-slip events are necessary to induce switching, there is an experimentally accessible temperature- and current-range for which a single phase-slip event is sufficient to switch the wire to the normal (resistive) state. I will conclude by arguing that switching-current statistics provide an effective probe to resolve individual phase-slip events and in addition offer unprecedented access to quantum phase-slip tunneling events.
CITATION STYLE
Shah, N. (2013). Probing individual topological tunneling events of a quantum field: Switching statistics of a superconducting nanowire. In Journal of Physics: Conference Series (Vol. 462). Institute of Physics Publishing. https://doi.org/10.1088/1742-6596/462/1/012046
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