Information leakages in code-based masking: A unified quantification approach

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Abstract

This paper presents a unified approach to quantifying the information leakages in the most general code-based masking schemes. Specifically, by utilizing a uniform representation, we highlight first that all code-based masking schemes’ side-channel resistance can be quantified by an all-in-one framework consisting of two easy-to-compute parameters (the dual distance and the number of conditioned codewords) from a coding-theoretic perspective. In particular, we use signal-to-noise ratio (SNR) and mutual information (MI) as two complementary metrics, where a closed-form expression of SNR and an approximation of MI are proposed by connecting both metrics to the two coding-theoretic parameters. Secondly, considering the connection between Reed-Solomon code and SSS (Shamir’s Secret Sharing) scheme, the SSS-based masking is viewed as a particular case of generalized code-based masking. Hence as a straightforward application, we evaluate the impact of public points on the side-channel security of SSS-based masking schemes, namely the polynomial masking, and enhance the SSS-based masking by choosing optimal public points for it. Interestingly, we show that given a specific security order, more shares in SSS-based masking leak more information on secrets in an information-theoretic sense. Finally, our approach provides a systematic method for optimizing the side-channel resistance of every code-based masking. More precisely, this approach enables us to select optimal linear codes (parameters) for the generalized code-based masking by choosing appropriate codes according to the two coding-theoretic parameters. Summing up, we provide a best-practice guideline for the application of code-based masking to protect cryptographic implementations.

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Cheng, W., Guilley, S., Carlet, C., Danger, J. L., & Mesnager, S. (2021). Information leakages in code-based masking: A unified quantification approach. IACR Transactions on Cryptographic Hardware and Embedded Systems, 2021(3), 465–495. https://doi.org/10.46586/tches.v2021.i3.465-495

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