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Raman spectroscopy for characterization of semiconducting nanowires

Springer-Verlag Berlin Heidelberg, (2011), 477-506
DOI: 10.1007/978-3-642-20620-7_17
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Abstract

Raman scattering behavior germane to semiconductor nanowires (NWs) and the application of Raman spectroscopy to characterize the structure, composition, strain, and temperature of individual semiconductor nanowires with submicron resolution are discussed.

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Doerk, G. S., Carraro, C., & Maboudian, R. (2011). Raman spectroscopy for characterization of semiconducting nanowires. In Raman Spectroscopy for Nanomaterials Characterization (Vol. 9783642206207, pp. 477–506). Springer-Verlag Berlin Heidelberg. https://doi.org/10.1007/978-3-642-20620-7_17

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