Control of Schottky barrier heights by inserting thin dielectric layers

14Citations
Citations of this article
45Readers
Mendeley users who have this article in their library.
Get full text

Abstract

The insertion of ultra-thin dielectric layers to lower n-type Schottky barrier heights is shown to partly involve the creation of a net interfacial dipole as well as unpinning of the Fermi level by suppression of metal-induced gap states. The existence of a net dipole requires a lack of cancellation of dipoles at the two interfaces. This requires a different metal(Ge)-O bond density at the two interfaces, in general requiring differing oxygen chemical potentials. This would need the inserted dielectric to be a diffusion barrier, not just able to create dipoles, favoring the use of Al 2O 3-based or nitrided dielectrics. © 2012 American Institute of Physics.

Cite

CITATION STYLE

APA

Lin, L., Li, H., & Robertson, J. (2012). Control of Schottky barrier heights by inserting thin dielectric layers. Applied Physics Letters, 101(17). https://doi.org/10.1063/1.4764521

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free