Control of Schottky barrier heights by inserting thin dielectric layers

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Abstract

The insertion of ultra-thin dielectric layers to lower n-type Schottky barrier heights is shown to partly involve the creation of a net interfacial dipole as well as unpinning of the Fermi level by suppression of metal-induced gap states. The existence of a net dipole requires a lack of cancellation of dipoles at the two interfaces. This requires a different metal(Ge)-O bond density at the two interfaces, in general requiring differing oxygen chemical potentials. This would need the inserted dielectric to be a diffusion barrier, not just able to create dipoles, favoring the use of Al 2O 3-based or nitrided dielectrics. © 2012 American Institute of Physics.

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CITATION STYLE

APA

Lin, L., Li, H., & Robertson, J. (2012). Control of Schottky barrier heights by inserting thin dielectric layers. Applied Physics Letters, 101(17). https://doi.org/10.1063/1.4764521

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