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Label-Free Super-Resolution Microscopy by Nonlinear Photo-modulated Reflectivity

  • Tzang O
  • Hershkovitz D
  • Cheshnovsky O
DOI: 10.1007/978-3-030-21722-8_11
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Abstract

Nonlinear photo-modulated reflectivity (NPMR) for far-field, label-free, super-resolution (SR) microscopy is based on the nonlinear changes in the reflectance of materials, induced by an …

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Tzang, O., Hershkovitz, D., & Cheshnovsky, O. (2019). Label-Free Super-Resolution Microscopy by Nonlinear Photo-modulated Reflectivity (pp. 261–287). https://doi.org/10.1007/978-3-030-21722-8_11

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