CITATION STYLE
Jungemann, Chr., Keith, S., Meinerzhagen, B., & Engl, W. L. (1995). On the influence of band structure and scattering rates on hot electron modeling. In Simulation of Semiconductor Devices and Processes (pp. 222–225). Springer Vienna. https://doi.org/10.1007/978-3-7091-6619-2_53
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