X-ray Computed Tomography (CT) in combination with a tensile/compression stage can deliver great insights in the damage mechanisms of a material. As the material properties change at low and high temperatures, materials may perform differently as they do at room temperature. In this paper, a novel Mechanical In-situ Stage with Temperature control (MIST) for the usage in laboratory CT devices for high resolution - (3 μm)³ - acquisitions is presented. Since the specimen temperature is controlled by air flow, the MIST stage is suitable for testing polymers and allows cooling and heating in one test cycle (-10 °C to +100 °C). The MIST stage is a modification of the CT500 DEBEN tensile/compression stage. It enables mechanical tests that combine the application of force and temperature on a sample at the same time. A technical description of the developed stage is presented. Furthermore, its advantages compared to existing devices are explored and application fields of the MIST are shown.
CITATION STYLE
Kastner, J. (2023). MIST – Mechanical In-situ Stage with Temperature control for X-ray computed tomography. E-Journal of Nondestructive Testing, 28(3). https://doi.org/10.58286/27762
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