CITATION STYLE
Kuo, W., Chien, W.-T. K., & Kim, T. (1998). Yield and Modeling Yield. In Reliability, Yield, and Stress Burn-In (pp. 65–91). Springer US. https://doi.org/10.1007/978-1-4615-5671-8_4
Mendeley helps you to discover research relevant for your work.