Generation of Misfit Dislocations in Highly Mismatched GaN/AlN Layers

Bai, J., Wang, T., Parbrook, P. J., Lee, K. B., Wang, Q., & Cullis, A. G. (2008). Generation of Misfit Dislocations in Highly Mismatched GaN/AlN Layers. In Microscopy of Semiconducting Materials 2007 (pp. 33–36). Springer Netherlands. https://doi.org/10.1007/978-1-4020-8615-1_7