Analysis of the total scattering using the quantitative high pressure pair distribution function: Practical considerations

Abstract

Technical developments in high energy (E > 60 keV) total x-ray scattering at synchrotron storage rings allow collection of quantitative data from samples in high pressure devices. The infrastructure now in place facilitates advances in our understanding of how disorder, composition, P and T interact to stabilize and to properties of disordered crystalline, nano-crystalline, glassy and liquid materials at high PT. Key developments include over sampling using area detectors, focusing of beams with E > 80 keV and modifications to diamond anvil cells that in combination mitigate problems that limit the resolution and precision with which disordered materials can be studied. © 2010 Springer Science+Business Media B.V.