Polarization measurement of SR from a helical undulator using a quarter-wave plate for a wavelength of 12.8 nm

Abstract

At a wavelength of 12.8 nm, polarization states of nominally circularly polarized light emitted from a helical undulator and monochromatized by a grating monochromator were measured (KEK-PF BL-28A). With a transmission-type multilayer quarter-wave plate and a multilayer mirror polarization analyzer mounted on a beamline ellipsometer, all polarization parameters of the circularly polarized SR at various conditions were determined. The best degree of circular polarization after the grating monochromator was found to be as high as 0.95. © 1995 American Institute of Physics.