Abstract
With the large amount of current research and development focused on nano wires, carbon nano tubes, and other nano scale materials, imaging these materials has become a large part of the challenges involved.
Cite
CITATION STYLE
APA
Kleindiek, S., Dadras, M., Schock, K., Lieb, A., & Renka, G. (2016). Combining SEM with AFM for in situ Correlative Microscopy. In European Microscopy Congress 2016: Proceedings (pp. 999–1000). Wiley. https://doi.org/10.1002/9783527808465.emc2016.5289
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