IR spectroscopy and spectromicroscopy with synchrotron radiation

Abstract

Properties of infrared emission from synchrotron radiation, beamline specificities and optimization, and multidisciplinary applications are the main content of this chapter. Bending magnets are the essential source of infrared emission, and simplified formulas are provided to allow calculating flux and brilliance for a particular beamline. The requirements for large vertical and horizontal collection angles in this long wavelength regime impose appropriate optics to collect and propagate efficiently the beam to the instruments. Present prototypical optical setups exhibit aberration, which can be eliminated using appropriate optics described in this chapter. Example for a specific facility is given which may help improving existing beamlines. Spectroscopy and microscopy are the main approaches exploited, using commercially available instruments. These instruments are briefly described as well as the most relevant detectors used in infrared. Emerging techniques are shown, such as IR tomography and nano-infrared spectroscopy and imaging. For the latter, few beamlines operate presently a nanoinfrared instrument, and several are under development. Numerous applications have been reported over the last 20 years, and for each of them, this chapter gives some examples and the related references. The recent application in nanospectroscopy and imaging is emphasized in the application section.