The annotated bibliography highlights work in thearea of algorithmic test generation from formalspecifications with guaranteed fault coverage, i.e.,fault model-driven test derivation. A fault model isunderstood as a triple, comprising a finite statespecification, conformance relation and fault domainthat is the set of possible implementations. Thefault model can be specialized to Input/Output FSM,Labeled Transition System, or Input/Output Automatonand to a number of conformance relations such as FSMequivalence, reduction or quasi-equivalence, traceinclusion or trace equivalence and others. The faultdomain usually reflects test assumptions, as anexample, it can be the universe of all possible I/OFSMs with a given number of states, a classicalfault domain in FSM-based testing. A test suite iscomplete with respect to a given fault model wheneach implementation from the fault domain passes itif and only if the postulated conformance relationholds between the implementation and itsspecification. A complete test suite is said toprovide fault coverage guarantee for a given faultmodel.
CITATION STYLE
Petrenko, A. (2001). Fault Model-Driven Test Derivation from Finite State Models: Annotated Bibliography (pp. 196–205). https://doi.org/10.1007/3-540-45510-8_10
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