The physical processes occurring in junctions and weak links are encoded in their I–V characteristics. In this Chapter we discuss the main notions on the modeling of I–V curves with reference to the microscopic theory mostly applied to tunnel junctions, and to the Resistively Shunted Junction model, which provides appropriate tools to describe the enlarged family of weak links. Modeling I–V curves is the first step to define the transport mechanisms of a junction, its electrodynamics, and to understand its potential for applications in real circuits.
CITATION STYLE
Massarotti, D., & Tafuri, F. (2019). Current–Voltage Characteristics. In Springer Series in Materials Science (Vol. 286, pp. 235–274). Springer Verlag. https://doi.org/10.1007/978-3-030-20726-7_7
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