Quantification of local boundary migration in 2D/3D

Abstract

With the development of advanced electron and X-ray microscopy techniques, the local boundary migration during recrystallization and grain growth can be followed in 2D at a sample surface and/or in 3D inside bulk samples during in/ex situ annealing. The results show that locally boundaries migrate in a much more complex way than commonly imagined, for example by the development of local protrusions and retrusions and by migrating in a stop-go type of fashion. A quantitative analysis of the local boundary migration is essential for understanding this heterogeneous process. In this paper, methods for quantifying local boundary migration are summarized, including methods for quantification of local boundary migration velocities, misorientation (angle/axis pair) and plane normal of migrating/non-migrating boundaries, driving force (from both the energy stored in the deformation matrix and local boundary curvature), boundary mobility and activation energy. Through a quantitative analysis of both experimental and simulation data, local boundary migration is rationalized in several material systems during recrystallization and grain growth.