Skip to main content
Book Chapter

A New Statistical Enhancement Technique in Parallelized Monte Carlo Device Simulation

  • Shigeta K
  • Tanaka K
  • Iizuka T
  • et al.
Springer Vienna, (1995), 384-387
DOI: 10.1007/978-3-7091-6619-2_93
N/ACitations
Citations of this article
1Readers
Mendeley users who have this article in their library.
Get full text

Abstract

A new statistical enhancement technique (split-and-remove technique) in Monte Carlo device simulation, which is suitable for parallel processing, has been developed. By using this technique, an accurate energy distribution function near the drain edge can be obtained within a reasonable CPU time. (3 References).

Cite

CITATION STYLE

APA

Shigeta, K., Tanaka, K., Iizuka, T., Kato, H., & Matsumoto, H. (1995). A New Statistical Enhancement Technique in Parallelized Monte Carlo Device Simulation. In Simulation of Semiconductor Devices and Processes (pp. 384–387). Springer Vienna. https://doi.org/10.1007/978-3-7091-6619-2_93

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free