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Journal Article

Atomic force microscopy study of the tetragonal to monoclinic transformation behavior of silica doped yttria-stabilized zirconia

Journal of Materials Science (2005) 40(14) 3821-3823
DOI: 10.1007/s10853-005-2550-2
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Deville, S., Chevalier, J., & Gremillard, L. (2005). Atomic force microscopy study of the tetragonal to monoclinic transformation behavior of silica doped yttria-stabilized zirconia. Journal of Materials Science, 40(14), 3821–3823. https://doi.org/10.1007/s10853-005-2550-2

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