Physical Properties of Nano-Composite Silica-Phosphate Thin Film Prepared by Sol Gel Technique

Abstract

A series of nano-composites silica-phosphate thin films SiO 2 -P 2 O 5 and silica-phosphate doped with different concentra-tions of Er 3+ ions have been synthesized using tetraesoxysilane TEOS, triethylphosphate TEP and erbium nitrate as precursor sources of silica, phosphorus and erbium oxides. The structural properties of the prepared samples were stud-ied, using x-ray diffraction (XRD) and Fourier Transform Infrared (FTIR). The morphology of silica-phosphate was characterized by Scanning electron microscope (SEM).