CITATION STYLE
Scheerschmidt, K. (2009). Description of electron microscope image details based on structure relaxations with enhanced interaction potentials. In EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany (pp. 151–152). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_76
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